Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...

Instrumental's AI-powered Synchronized Learning detects defects in high-density connectors with 99.9% accuracy — ...

A recent study published in the journal Carbon focuses on the application of high-powered laser pulses of brief duration for inducing minute defects in lithium-ion battery materials, which in turn ...

A new study reports that machine learning with computer simulations could improve efficiency to 40.17 % in CH3NH3SnI3 ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

In this Q&A, you will learn about some of the technologies and techniques that are making it possible to address advanced ...

Researchers found a way to tune the spin density in diamond by applying an external laser or microwave beam. The finding could open new possibilities for advanced quantum devices. Electronic devices ...

TSMC exposed the defect density (D0) of its N2 process technology relative to its predecessors at the same stage of development at its North American Technology Symposium this week. According to the ...

SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

Chemical mechanical planarization (CMP) is required during semiconductor processing of many memory and logic devices. CMP is used to create planar surfaces and achieve uniform layer thickness during ...