This wideband capability allows engineers to address diverse applications including broadband RF and microwave component ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

How often have you struggled to verify static random-access memory (SRAM) blocks in your design? And how often, no matter how much time you spend on them, do they end up causing manufacturing issues?

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

Software testing has evolved significantly over the past decade. What began as heavily manual validation gradually shifted toward automation frameworks and continuous integration pipelines. Today, a ...

WESTBROOK, ME—Systems integrator Lanco has been awarded a contract to design and build an automated, pallet-based test system ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Test automation has always been about speed. We measured success by how many tests we ran per minute and celebrated shorter regression cycles. However, we now stand at the edge of the next evolution.