AZoM on MSN

Imaging silicon defects using Raman and PL multivariate imaging

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
IEEE

Partial Discharge Localization Based on Direct Data-Reusing TDE Algorithm With Generalized Cauchy Loss

Abstract: The presence of impulsive noise can significantly compromise the localization accuracy of partial discharge (PD). To address this problem, the direct data-reusing time-delay estimation (TDE) ...
Open Heart

Artificial intelligence-based clustering to identify functional risk phenotypes in heart failure

Background Patients with heart failure (HF) frequently suffer from undetected declines in cardiorespiratory fitness (CRF), which significantly increases their risk of poor outcomes. However, current ...
IEEE

Direct Spectral Clustering With New Graph Learning for Better Fitting

Abstract: Traditional spectral clustering methods struggle with scalability and robustness in large datasets due to their reliance on similarity matrices and EigenValue Decomposition. We introduce two ...