Abstract: The concept of the radiative microstrip line antenna by breaking the symmetry of the fringing E-fields has been reported previously. Existing relevant studies are all with vertical ...
Abstract: Line edge roughness (LER) is an undesirable phenomenon that arises during semiconductor fabrication processes, causing fluctuations in the characteristics of semiconductor devices and ...
aDepartment of Surgery, Regional Academic Cancer Center Utrecht, UMC Utrecht Cancer Center & St Antonius Hospital Nieuwegein, Utrecht University, Utrecht, Netherlands bDepartment of Medical Oncology, ...
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