Abstract: As the feature size of integrated circuit (IC) continues to shrink, the soft failure probability induced by single event upset and single event transient (SEU/SET) for ICs exposing to space ...
Children younger than 6 are considered most at risk of exposure due to their tendencies to put objects such as toys and dirt ...
Bura, A.H. and Mung’onya, E.M. (2026) A Novel ICT-Enabled Decision Support Approach for Surveillance and Control of ...
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