Abstract: Estimating the reliability of electronic devices involves identification of failure mechanisms and prediction of lifetimes. For parameter estimation and failure mode identification in ...
Abstract: This article proposes an expectation maximization sample transfer identification (EM-STI) algorithm to address the parameter identification problem in dynamic systems with nonideal data.
This paper studies the fair influence maximization problem with efficient algorithms. In particular, given a graph G, a community structure C consisting of disjoint communities, and a budget k, the ...
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